Part Number:BQ76940
Dear Ti Experts,
I'm designing a product with bq76940 and I have a few schematic questions. Please help me to figure it out.
Q1:I noticed that a diode is connected from VC5 to VC5X in applicaion of bq76940. I wonder why and can this diode be eliminated or directly short?
Q2:There's a paragraph titled reduced test time saying that a special debug and test configuration bit is provided in the SYS_CTRL2 register, called [DELAY_DIS]. Setting [DELAY_DIS] bypasses the OV/UV protection fault timers and allows a fault condition to be registered within 200 ms after application of such a fault condition. I'm confused about how the test time be reduced.Can you explain it more clearly?
Thanks a lot.