Part Number: LM285-2.5
Hi,
(Part number : LM285BXMX-2.5/NOPB , Application : DCS card)
My industry customer encountered Vref (reverse breakdown voltage) shifted problem after certain period of usage time.
Customer actually captured Vref value during production for their tuning calculation.
However, the device's Vref is slightly shifted after certain period of using/aging at their end customer.
In this case, 2 pcs of IC were used in one PCB (normally both IC are from same lot and have similar Vref).
The failed IC Vref is measured as 2.484V while the other OK IC is 2.495V. So customer concluded that the Vref of failed IC should be around 2.5V during production time.
Customer understood TI's part has no problem and meet the datasheet specification.
However, they would like to know the stability of the Reverse breakdown voltage(Vref),.
How long does the device needed to age until it becomes stable?
Is there any data of Vref level that TI able to provide before & after aging test?
Or what is the percentage of Vref shifted before and after device aging?
Thanks.
Best regards,
Chin