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BQ27421-G1: Voltage drop

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Part Number:BQ27421-G1

My customers are developing products with BQ25601RTWR and BQ27421YZFR-G1A.

If only BQ25601RTWR is used, the system will operate normally even at 3.5V battery voltage.

However, when BQ25601RTWR and BQ27421YZFR are used together, the SYS voltage drops by about 0.1V.

This causes the problem that the subordinate ap constantly resets.

Due to the difference in operating time, the customer wants to eliminate the phenomenon that the bat voltage is dropped to the SYS voltage even with the use of the fuel gauge.

If necessary, ic replacement is possible.

Is there a solution or an IC that you can recommend separately?

BAT_OUT waveform at system reset


BQ35100EVM-795: Battery Management Studio (bqStudio) not working with BQ35100EVM

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Part Number:BQ35100EVM-795

We have installed Battery Management Studio (bqStudio)  (version1.3.86), as well as the Chemistry Updater geïnstalleerd (version 26 July 2018). We've also tested bqStudio v1.3.54.1 and BQSTUDIOTEST v1.3.80 Build 1. We keep getting the following error: "The detected device is not compatible with this application! Some actions could cause the device to lose communication permanently and enter an unrecoverable state. Proceed at own risk."

PLEASE ADVISE!

Doubts related to Impedance Tracking work?

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Hi,

I was going through some of your documents on impedance tracking. I wanted to understand how it works so that I can shift to Impedance track from CEDV gauge that I have.

This is my understanding:

Qmax is the full capacity that is first learned by calculating Passed Charge/(SOC1 - SOC2). During current discharge, coulomb counting is used to update the SOC. At some specific points of DOD, resistance update takes place and you store it in a lookup table. After that,

Full charge capacity is updated, Full Charge Capacity = Qstart + Passed Charge + Remaining Capacity. The Remaining Capacity is estimated by a simulation which decreased the DOD till the termination voltage is reached.

I have following doubts now:

1. Is Qmax same as Full Charge Capacity? Do we keep updating Qmax = Passed Charge/(DOD1 - DOD2) during 2 relaxed states during the normal running application? OR Full charge capacity takes care of the new capacity of the battery as the battery ages? Basically, I am confused between Qmax and FCC (full charge capacity). Are FCC and Qmax same at the start and how do they update during the normal run?

2. Does internal impedance play a role only for measuring the remaining capacity RM? How does it take into account the SOH? I am unable to understand it intuitively. I understand that internal impedance will increase with aging but how are we using this fact?

3. How many resistance measurements do you have in the look-up table? Do you interpolate the rest of them?

4. What is the difference between:

DataRAM.Full Charge Capacity( ) and DataRAM.Full Available Capacity( ) and DataRAM.Nominal Avail. Capacity( )

5. Does not the OCV voltage also change with aging of batteries?  

Compiler/BQ27520-G4: Bq27520 development board temperature measurement is not accurate

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Part Number:BQ27520-G4

Tool/software: TI C/C++ Compiler

Bq27520 development board temperature measurement is not accurate


At present, we use the demo board of bq27520 to connect our battery for temperature calibration (the TS of the demo board is connected to the temperature sensing pin of the battery).

The actual battery temperature was measured at 30 degrees, but the temperature displayed in the bqstudio interface was 56 degrees. The temperature did not change after calibration and was still 56 degrees.

Later I learned that I need to modify the temperature coefficients ext a coef 1-5 and ext b coef 1-4 in DATA FLASH.

The manual says that you need to use a 10K NTC 103AT type thermistor. The thermistor we are currently using is NCP15XH103F03RC, B-Constant

25-50 degrees is 3380K, I don't know if it is related to the requirements in the manual.

symbol? If it does not match how to calculate to modify the parameters?

BQ40Z80: BQ40Z80 for High-Voltage 5S LiPo batteries

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Part Number:BQ40Z80

I am exited about the new chip and I was wondering when it will be available

We are currently starting the develpment of the BMS and will need following quantities:

  • Development/Prototyping
    • Q3 2018
    • 50-100 samples

  • Preproduction
    • Q3 2018
    • 200-300 units
  • Production
    • Starting Q1 2019
    • 5-10 kunits/year (after ramp up)

I have following question:

  • Supply chain:
    • When will the chip be available?
    • Can you meet the above mentioned quantities?
    • What is the expected lead time?
    • Do you see any supply chain issues? (being electronics such a hot topic nowadays)
  • Tech
    • Does the chip works with HV cells? (4.35 V/cell max)
    • Impedance Track vs. CEDV which is better?
    • Does impedance track needs calibration/training?
    • How difficult is to adapt the firmware to a specificion application?
      • i.e. is just a matter of adjusting parameters or does it need some more coding?
    • Would be the firmware used on a evalboard the same as the used for production?
    Thanks in advance for all the information you can provide

Best

Federico

BQ28Z610: bqStudio not working as expected with BQ28Z610

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Part Number:BQ28Z610

Still no luck setting the OCD value for one...

Looking for engineering support with Texas Instruments Battery Charge/Discharge Management IC; BQ28z610.

 

We have PCB design and layout complete and prototypes in hand with bring up validated.

 

We need help in getting the registers and flash correctly configured with Texas Instruments bqStudio software.

 

Please put me in touch with the right person who can provide a quote so can send them the prototypes and receive from them the correct configuration and ultimately the “golden file” for production.

BQ34Z100-G1: QEN bit & Data Memory

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Part Number:BQ34Z100-G1

Once the QEN bit has been set, is it possible to change values in the Data Memory?

I have been struggling for weeks now trying to piece together how to use this device from scattered bits of sometimes inaccurate information. For example: 7.3.3.1 Accessing Data Flash (SLUSBZ5B-JANUARY 2015-REVISED JULY 2016) on step 8 states:

“8. The new value for new_Pack_Configuration_MSB can be written by writing to the specific offset location. For example, to write 1-byte new_Pack_Configuration_MSB to Pack Configuration (offset=0) located at 0x40, use command (wr 0x4B new_Pack_Configuration_MSB)”

WHY would it work writing to 0x4B?...is this yet another diversionary TYPO?

During my many attempts at a learning session to create a Golden File, I did enable IT.

In the previously mentioned document under: 7.3.1.2.15 IT ENABLE: 0x0021 it states: “Once set, [QEN] cannot be cleared. This command is only available when the fuel gauge is UNSEALED and is typically enabled at the last step of production after the system test is completed.”

Is this similar to the I2C/HDQ one-shot only feature?...no going back? Does it physically blow a fuse that even a complete firmware update cannot return you from? Am I hosed if I enable IT before completely configuring the Data Memory?

I have carefully attempted to change the default “LION” to “NiMH” in the Data Memory with no success as of yet.

Following is a log sequence of a recent attempt:------------

Advanced Comm Transaction Log

TimeStamp , Read/Write , Address , Register , Length , Data ,

2018-07-06 02:11:08 931 , Wr , aa , 00 , 2 , 14 04

2018-07-06 02:11:22 200 , Wr , aa , 00 , 2 , 72 36

2018-07-06 02:11:37 558 , Wr , aa , 61 , 1 , 00

2018-07-06 02:12:04 684 , Wr , aa , 3e , 1 , 30

2018-07-06 02:12:18 870 , Wr , aa , 3f , 1 , 01

2018-07-06 02:12:31 390 , Rd , aa , 40 , 32 , 62 71 33 34 7A 31 30 30 2D 47 31 0B 54 65 78 61 73 20 49 6E 73 74 2E 04 4C 49 4F 4E 00 00 00 00

2018-07-06 02:13:02 605 , Rd , aa , 58 , 5 , 4C 49 4F 4E 00

2018-07-06 02:13:24 776 , Rd , aa , 60 , 1 , E3

2018-07-06 02:14:19 561 , Wr , aa , 58 , 4 , 4E 69 4D 48

2018-07-06 02:14:36 356 , Wr , aa , 60 , 1 , C9

2018-07-06 02:14:44 042 , Rd , aa , 60 , 1 , E3

2018-07-06 02:14:59 451 , Rd , aa , 40 , 32 , 62 71 33 34 7A 31 30 30 2D 47 31 0B 54 65 78 61 73 20 49 6E 73 74 2E 04 4E 69 4D 48 00 00 00 00

------------------

Following are my notes that accompany the log file:-------

Example trial: Change “LION” to “NiMH” for Device Chemistry; Subclass ID 30, block 1, offset 23, length 5

[*] = 0x6ea -> 0xea (partial CheckSum)

[62 71 33 34 7A 31 30 30 2D 47 31 0B 54 65 78 61 73 20 49 6E 73 74 2E 04] 4C 49 4F 4E 00 00 00 00 ---> E3 [old]

LION = 0x32

[62 71 33 34 7A 31 30 30 2D 47 31 0B 54 65 78 61 73 20 49 6E 73 74 2E 04] 4E 69 4D 48 00 00 00 00 ----> C9 [new?]

NiMH = 0x4c

(wr 0x00 0x14 0x04) -- 1st 2 bytes to UNSEAL

(wr 0x00 0x72 0x36) -- 2nd 2 bytes

(wr 0x61 0x00) -- BlockDataControl()

(wr 0x3e 0x30) -- DataFlashClass()

(wr 0x3f 0x01) -- block offset DataFlashBlock()

(rd 0x40 0x20) -- shows full 32 byte page

(rd 0x58 0x05) -- only the 5 bytes

(rd 0x60 0x01) -- read the CheckSum

(wr 0x58 4E 69 4D 48) -- write "NiMH"

(wr 0x60 0xC9) -- write the new CheckSum

(rd 0x60 0x01) -- read the CheckSum

(rd 0x40 0x20) -- show full 32 byte page

------

This component has already been designed into our battery fuel gauge circuit and I have been tasked with implementing the firmware. There is a fine-line between being challenged and frustrated….this project has been both.

Am I simply not calculating the CheckSum properly? The documentation suggests that when I write a correct CheckSum to 0x60 that the 32 byte buffer @ 0x40 will be written to flash. I have clearly shown the ability to change the values within the buffer, but am unable to change the CheckSum value and get things changed in Data Memory.

Any insight into how to make things work will be greatly appreciated.

Best regards,

-Steve

BQ40Z50-R1: error code

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Part Number:BQ40Z50-R1

When we checked I2C signals between the battery and the charger, battery

answered "0x0087" as battery status.

Almost all answers from battery include "7" code.

"7" means "The Smart Battery detected an unidentifiable error."

Please advise how to solve this issue. 

The IC we use on the battery pack is BQ40Z50.

Is this issue related to pull up resistor?

Thank you.


BQ78350-R1: BQ78350-R1 Reading Unseal and FullAccess Key and changing them

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Part Number:BQ78350-R1

I have designed battery management system with Bq78350-R1 and Bq76940 and programmed its data memory. Now I would like to read unseal and fulleccess keys and change them for sealing my device. Many times I have read the pages releated to this topic in the bq78350-R1 datasheet. Although ı have experience about sealing the battery management ICs like Bq20Z655, I can not understand the instructions of the datasheet for sealing the IC. (I am using Battery Management Studio)

Can you please explain to change the unseal key step by step? Thank in advance.

BQ4050: Can this gauge device also being used for accu packs (4SP1) without the balancing function?

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Part Number:BQ4050

I want to use the gauge and protection (1e and 2e) functionality of this device, for a 4 cell battery pack. This pack doesn't require cell balancing according to the manufacturer, and only 3 wires (+, -, NTC) comes out of the pack. The pack will be charged external to my product. 

Is it than still be possible to monitor the state of charge of the pack with this device?
Any help is appreciated!

BQ34Z100-G1: Accessing Data Flash and altering Registers

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Part Number:BQ34Z100-G1

Hi,

I've been trying to configure the BQ34Z100 via I^2C Block Commands. So far it worked for me to perform normal Commands such as Voltage() or read out the DEVICE_TYPE. But when it comes to altering some Flash Registers it won't work the way I try it. 

For example I tried to follow the example from the data sheet to set the VOLTSEL bit in the Pack Configuration Register. I do the exact same things as described in the data sheet. First problem is that the value I get for this register is not the default value as expected (0x01 for MSB?!) but 0xD9. Non the less I tried to alter this register values and read them out afterwards but I still get the same values as before. To calculate the checksum I also use the formula as shown in the data sheet.

I tried many different things to get this to work and also searched hear for a solution but couldn't find one.

One more thing: which registers need unsealed access? I wasn't able to find that info in the data sheet.

Thanks in advance and I really appreciate a soon answer.  

Resolution of BQ34Z100-G1

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I have a question about BQ34Z100-G1.

Do you know the resolution of this IC?

We want know minimum reading current(mA).

Best regards,

Takahiro Nishizawa

BQ27750: Question for SLEEP Mode Type for BQ27750

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Part Number:BQ27750

Hi 

Now I have one question for SLEEP Mode BQ27750.

[ Question ] 

  This BQ27750 has 2 SLEEP Mode Status.  

       a)  Operation Status   A   SLEEP
  b)  Operation Status   B  SLEEPM

Could you tell us  about this 2 type SLEEP Mode Detail ? 

I think  ,  a) is  SLEEP Mode for  Current setting and  b) is  Bus Access Condition SLEEP ??

Because of Our customer want to know about this SLEEP Mode Detail for Host side 

SW status check .

Thanks and Regard

March Jasper  (  Sugimoto Japan Disty   ) 

BQ40Z50-R1: srec programming

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Part Number:BQ40Z50-R1

Hi, I'm developing a code to program the srec using a third party tool and I want to know what areas I have to program.

Do I have to program only data (address : 0x4000-0x5FFF)? Or do I have to program also the fw (from address 0x100000)? Or the calibration (0x140000) too?

From my point of view I think the only necessary data to program are from 0x4000 to 0x5FFF. Is correct?

Thanks in advance

Enrico

BQ28Z610: How to automate the test in production stage?

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Part Number:BQ28Z610

Hello !

Can we automate bqProduction/bqMTester with a functional interface of test (without operator to push start button)?

and How? (source code modified?) 

Thanks.


BQ40Z80: Product's schedule

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Part Number:BQ40Z80

Dear, 

I would like to know when your product will be in mass production?

Do you have a provisional schedule?

Best Regards, 

Loïc

BQ27742-G1: Help help to review Golden image and Integration of golden image in code

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Part Number:BQ27742-G1

Hello All,

I need Help in reviewing Golden Image

Fuel gauge : bq27742-G1 From TI

Cell : Li - Ion Rechargeable cell

MCU : STM32

We have followed learning cycle of Fual Guage.
At end of Learning Cycle, we got Golden Image.

We are having two queries

1. We need your help to review this Golden Image
2. How we can Integrate this golden image in our Firmware/code? (Any Link/Document)

Please help here.

BQ40Z50-R1: Permanent Failure/Fuse Blow events

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Part Number:BQ40Z50-R1

TI Team,

I am observing a peculiarity with the bq40z50-R1 that I need resolved.  I am currently using the 2LVL failure input to detect a secondary protector (bq771612) fault.  My desire is to have the fuse drive maintained on a secondary protector fault even in the event that the pack being shorted by the fuse blow mechanism is dragged down below the  secondary protector recovery voltage.  We have seen some anomalies that cause a partial failure of the fuse blow mechanism which may be due to an inadequate fuse blow FET and wish to guarantee by testing that changing the FET will solve the problem.

In my investigation I have discovered that the fuse blow drive will release if the cell voltage is dropped approximately 50mV below the COV recovery.  I thought that this may be an anomaly of the 2LVL Permanent Failure/Fuse Blow event, but I discovered that I get the same reset if I continue to drive the cell voltage above the SOV threshold.

While both Permanent Fail events are logged in the data bit registers, I am puzzled as to why the fuse drive is going away.

Any recommendations?

George Mortimer

BQ40Z50-R2: Not showing up in BQstudio

BQ35100: Sudden SOH Drop to 0%

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Part Number:BQ35100

Hi Team,

My customer is evaluating the BQ35100EVM with 4S Duracell CR17345 batteries (ChemID 0703), but are having issues where SOH suddenly drops from close to 100% to 0%. I suspected a wrong terminate voltage, but it is well below their battery voltage. They are running in SOH mode following the slua904 guide. Any ideas what could be causing this? Please see bqStudio screenshots below:

Thanks,

Antonio

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