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BQ40Z60: BQ40Z60: Flash Records

August 30, 2018, 5:43 am
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Part Number:BQ40Z60

Dear
Faced a problem when programming BQ40Z60. We want programming BQ40Z60 for Mass Production without EV2300. We write through our microcontroller. The file with the data is formed as you advised ("BQ40Z60:BQ40Z60 What data is recorded at 0010x0000...").

We used recommendations from the TRM "11.1.63 0x4000-0x5FFF Data Flash Access()". Writing for 16 bits, then we wait for a response from BQ40Z60 with a checksum check. But often we do not get any answer. The time-out was increased to 5 seconds. The recording passes, but with errors (some bits are not true).
We can not understand how to record correctly. If there is no answer, do I have to write from the previous byte or start over from the beginning (0х4000)?
At the same time, if BQ40Z60 has already been written via EV2300, it is updated through our microcontroller without problems (the recording goes without interruptions and stops). The problem with the initial recording and configuration.

The record is produced Operating Status [SEC1=0, SEC0=1] (the default setting-device is shipped from TI in this mode (full access?))
Is there an error here?
To translate into SEC1 = 1 SEC0 = 0 it is obtained only by preliminarily "Sealed" SEC1 = 1 SEC0 = 1. And then you can translate immediately into SEC1 = 1 NUC0 = 0 (This according to Table 11-2 .Security Modes - full access?!). But with this, there are difficulties with the further re-recording of the software.
We are a bit confused.
I can send a video of how the record is made (with stops) and the state of the bits after the recording (because of errors they are different).
If possible, tell me how to correctly record, what time-outs. If possible, then a small piece of code (anat@monitor-ltd.ru) so that we understand what our mistake was and correctly recorded our initial settings and thresholds.

Best regards

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BQ2060A: BQ2060A - 0x17 sometimes recieved over SMBUS

August 30, 2018, 6:00 am
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Part Number:BQ2060A

I am experiencing a seemingly random issue with receiving data from the BQ2060a over SMBUS.

When I request the voltage from the device (0x09) I get the response 0xF22E ACK (12.03V) which is correct however on occasion (without any periodicity) I get the response 0x1717 ACK which is incorrect. Out of a sample of 37 voltage reads only 1 was incorrect.

The behaviour is not limited to the Voltage command but occurs on all of the values I am trying to read, for instance device name or current.

I am viewing the following signals on the SMBUS interface between a Smart Batter Manager (LTC1760) and the Gas Gauge BQ2060A

Correct:

Incorrect:

 

 

Has this behaviour been seen before? Is there any significance to the 0x17 response? Any advice on this would be greatly appreciated.

To ensure this was not a random failure I have tried this on a second prototype board and get the same behaviour. I have also tried changing some of the EEPROM memory values. This suggests to me this is either a problem with the wider hardware design or chip itself.

 

 

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BQ40Z50-R1: Why Valid Charge Termination Condition has met,but the VCT and FC not set 1.

August 30, 2018, 6:08 am
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BQ20Z45-R1: Short circuit between VCC and Ground

August 30, 2018, 7:31 am
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Part Number:BQ20Z45-R1

Hello,

I currently have 3 packs returned that have 20-30 ohms measured between VCC and GND.  This circuit is setup similar to the circuit in the reference design, with a diode and 1uF capacitor.  The only difference is that we have an added 10 ohm resistor inline to create an RC filter with the capacitor.  On all 3 of these units, we found the 10 ohm was open, which is an indication that this was drawing too much current.  Sure enough, we are getting the short circuit on VCC.

What can cause this failure?

Thanks,

Mike

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BQ27220: External NTC reporting different temparature depending on current

August 30, 2018, 7:49 am
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Part Number:BQ27220

Hi

I'm currently testing the accuracy of the external NTC temparature reading of the BQ27220 and found that the temparature differs by almost 2 degrees Celcius depending whether the battery provides 10mA or 1800mA.

Setup: 

External temparature 40 C, LiFePO, 95% charged

(1) I_BATT = 1800 mA, V_BATT = 3.1V   --> Temp_NTC  = 28.9 C (already converted from 0.1K)

(2) I_BATT =        9mA, V_BATT = 3.25V  --> Temp_NTC = 37.1 C

 The internal NTC reading also behaves similarly, but not as much as the external one.

Thanks for feedback on this behavior,

Mark

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BQ40Z80: Learning cycle - Behavior CHG and DSG FETs

August 30, 2018, 8:16 am
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Part Number:BQ40Z80

I'm working on a custom made board with PB40Z80 and preparing to run the learning cycle. BqStudio doesn't support this feature (yet), so I build a relay jig and wirting software to automate this process entirely. Therefore I strictly follow SLUA848. As a prerequisite, all the requirements from chapter 3 are configured and a GPC cycle was successfully run with ChemID programmed.

However, while writing software I observed that the CHG and DSG FETs will not stay ON, hence there is no voltage and current on the PACK pins. SLUA848 describes the following process in chapter 4.2.1 first bullet point:

Before beginning the discharge, turn on the charge and discharge FETs by sending command 0x22, or by sending the CHG_FET_TOGGLE and DSG_FET_TOGGLE commands until both the CHG and DSG bits are  shown as red in the Bit Registers. Next send IT (Gauge) enable command (0x21), or use the GAUGE_EN command to set the GAUGE_EN in manufacturing status register and QEN flags in IT Status register. Then send the reset command (0x41), or select RESET, to set the RDIS flag and disable resistance updates during this initial discharge cycle.


My observation is that, when CHG and DSG FETs are commanded ON, they will turn OFF as soon as the RESET command is send. Even when the FETs are commanded ON after the RESET, they will turn OFF with delay. My workaround is periodically commanding both FETs open while processing the cycle status. All other requirements are met so far.

So my questions:

Please can someone from product support can check and verify, that the process description in SLUA848, chapter 4.2.1 is correct and complete?

Can I run the learning cycle with charger and load VCC connected to BATTERY+ (VC6), while GND is connected to PACK- (current through shunt)? As descripted in SLUUBT4A, chapter 3.3.3.

What steps are required to set a BQ40Z80 into unlearned state? Can I repeat a learning cycle several times without messing up the gauging algorithm?

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BQ78350: SOC jump from 64% to 100% in charging mode and jump from 57% to 7% in discharge mode.

August 30, 2018, 8:46 am
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Part Number:BQ78350

I am using the BQ76940EVM eval board and a 12S1P 18650HG2 (Chem ID 2125) battery cells.

SOC jump from 64% to 100% in charging mode and jump from 57% to 7% in discharge mode (See graphics below).

Also please find the log files here:

(Please visit the site to view this file)

(Please visit the site to view this file)

Any help will be appreciated.

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BQ76940EVM: bq78350 SOC drop at some point

August 30, 2018, 9:14 am
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Part Number:BQ76940EVM

Hello,

I'm currently working with the BQ76940EVM, EV2300 and the latest BqStudio version (1.3.86.3).

When I discharge by battery pack, at some point the SoC and the remaining capicity are dropping down,

for example from 80 % to 7 %, the voltage is still displayed correct.

After a reset everything is correct for 2 seconds and then it fails again. The same happens during charging (goes up to 100%).

Do you have any idea what the problem is? I currently doing test for the GPC packger, can I use my results for the test even if some parts are wrong?

I attach a zip file with log and gg files.

(Please visit the site to view this file)

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BQ20Z655-R1: EVSW Display results to DF and DF to evsw display results

August 30, 2018, 1:38 pm
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Part Number:BQ20Z655-R1

I have a questions about the BQ20Z655-R1 chips that we currently use in some of our products. While programming some of these chips using a MIIC 203 iport/AFM I2C host adapter some of the calibration data is getting corrupt. I can use the bq evaluation software to see the areas of calibration that are incorrect. We would like to try and make our code more robust in order to handle these errors. The problem I’m having is converting the byte data into something I can’t use to see if a value like the CC Gain is within the min and max for this chip.

 

For example, using the MIIC 203 I can read back  ~15~81~6E~90~04~94~07~B7~31~5F~93~05~08~56~22~F8~C0~FF~63~00~FB~00

From a product that is calibrating correctly. The first 4 bytes (~81~6E~90~04) after ~15 would be the CC Gain. How do I convert this into a value that I can compare to the CC Gain min and max for the BQ20Z655-R1? The same explanation for how to convert cc Delta, ref Voltage, AFE Pack Gain, CC offset and Board offset would be great.

I have looked online and I’m unable to find this information.

 

An example of the correct data I’m seeing in the bq evaluation software for calibration:

How do I convert from the DF data to the data I’m seeing in the BQ evaluation software?

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BQ40Z60: how read CC Gain from dataflash ?

August 30, 2018, 6:26 pm
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Part Number:BQ40Z60

Dear TI Expert,

My customer is trying to use their own production tools to take the MP of BQ40Z60. Their tools and codes in PC works well on BQ30Z55's MP, however, when use the same code, they can't read out the "CC gain" from dataflash of BQ40Z60. Could you kindly give some advice what's the difference of "CC gain" between BQ30Z55 and BQ40Z60, how to change to code to meet BQ40Z60's requirment? Thanks a lot.

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BQ40Z60: how to set Threshold 1 and Threshold 2 in ASCD?

August 30, 2018, 7:09 pm
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Part Number:BQ40Z60

Dear Ti Experts,

My customer is not sure about how to set Threshold 1 and Threshold 2 in ASCD. The default value is 0x77 for Threshold 1. Does it mean to split [7:4] of 0x77 for duration(time S) , and [2:0] / Rsense for current (A) ?

As the TRM 2.8.3 shows as below? Thanks a lot.

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BQ20Z655: Calibration data getting corrupted on BQ20Z655-R1

August 30, 2018, 7:10 pm
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Part Number:BQ20Z655

Hello team,

Hope you are doing well. When you get a chance please see below question from the customer:

I tried using both documents (SLVA148A and how EVSW displays raw data) and none of the procedures are producing good results. If I start with the DF bytes and converted to what should be the  EVSW value and  it doesn’t match what actually appears in the EVSW. Same for if I go from the EVSW to DF. Using the “how EVSW display the calibrated raw data” document doesn’t work either. Is it possible that there is a different conversion process for the BQ20z655 chip?

BQ20Z655-R1 are currently used in some of our products. While programming some of these chips using a MIIC 203 iport/AFM I2C host adapter some of the calibration data is getting corrupt. I can use the bq evaluation software to see the areas of calibration that are incorrect. We would like to try and make our code more robust  in order to handle these errors. The problem I’m having is converting the byte data into something I can’t use to see if a value like the CC Gain is within the min and max for this chip.

For example, using the MIIC 203 I can read back  ~15~81~6F~1A~97~94~08~06~06~5F~93~05~08~56~22~F8~C0~FF~33~00~FB~00. The first 4 bytes(15~81~6F~1A) would be the CC Gain. How do I convert this into a value that I can compare to the CC Gain min and max for the BQ20Z655-R1?

I have looked online and I’m unable to find this information. An example of the incorrect data I’m seeing in the bq evaluation software  for calibration:

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BQ20Z45: FET Control History

August 30, 2018, 7:22 pm
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Part Number:BQ20Z45

Hello team,

Hope you are doing well. Please see below customer question:

Is there a “FET control” history available? Some of our returns are coming back with the FETs turned off.

They can be reset but I’d like to know how often this has happened and what caused it.

 

It is a follow-up from

 

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BQ40Z50-R1: Mosfet Rgs 10M function

August 30, 2018, 7:58 pm
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BQ28Z610: SCH and PCB review support need

August 30, 2018, 8:31 pm
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Part Number:BQ28Z610

Dear TI Experts,

Could you kindly help to review attached SCH and PCB? Thanks a lot. PCB is designed by protel 99.

(Please visit the site to view this file)

(Please visit the site to view this file)

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BQ4050: The latest FW verion and srec file

August 31, 2018, 12:57 am
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Part Number:BQ4050

Dears :

            Could you help to provide bq4050 the latest FW file and bqz ??

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BQ20Z655-R1: Charge Termination

August 31, 2018, 2:32 am
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Part Number:BQ20Z655-R1

Hi,

We are having a trouble with bq20z655 IC charge termination process. Primary charge termination doesn’t work at constant voltage charge phase. Our configuration is 2S and IC’s calibration is done.

Taper current is set to 500mA and Taper Voltage is set to 100mV. We have read pack and battery voltages from both multimeter and SBS window.

We are sure that average charge current is less than taper current and

Voltage + Taper Voltage ≥ ChargingVoltage     and

Max (CellVoltage4..1) + Taper Voltage ≥ ChargingVoltage / number of cells.

Discharge current is less than taper current (100mA) and charge current is less than taper current(50mA). Quit current is 10mA. Our capacity is 8250mAh so taper current is between C/10 and C/20.

What might be the problem? How can we fix it?

Thanks.

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BQ40Z50-R1: after sent 0x30 command,Disconnect the battery and reconnect,It becomes unseal state

August 31, 2018, 3:26 am
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Part Number:BQ40Z50-R1

Dear All:

I test the BQ40z50EVM-561,after sent 0x30 command,the SEC1 and SEC0 is set 1,when Disconnect the battery and reconnect,It becomes unseal state,the SEC1 is set 1 and SEC0 is set 0.after sent the 0x41 command,the SEC1 and SEC0 again is set 1.What happened?Please tell me the reason.Thanks a lot.

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WEBENCH® Tools/BQ27421-G1: BQ27421-G1 is not getting detected with BQStudio

August 31, 2018, 6:16 am
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Part Number:BQ27421-G1

Tool/software: WEBENCH® Design Tools

Hi,

I have connected BQ27421-G1 with BQStudio using EV2400. When I click on BQStudio GUI icon, I'm getting a pop-up asking me to select the device. Even if I select Fuel Gauge & BQ27421-G1, I'm not getting any acknowledgement from the device.

I have used pull-up resistors inside EV2400 for SCL & SDA lines.

I got battery voltage 3.8V at BAT pin & fuel gauge generated 1.8V at its VDD pin. This confirms that fuel gauge is working properly.

I'm using BQStudio v1.3.54.1 & EV2400 v0.18.

I'm not using EVM. I'm working on our design which uses BQ27421-G1 for measuring battery SOC.

I didn't understand what is the issue because of which BQ27421 is not getting detected with BQStudio. Please help in resolving the issue at the earliest.

Thanks & Regards

Vidyasagar Kunala

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BQ78350-R1: Return path of the SMBUS/ SYS PRES and potential issues

August 31, 2018, 8:14 am
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Part Number:BQ78350-R1

Recently, I did a PCB design consisting of the bq78350, bq76930, and the bq76200. The header that is in the battery is shown in Figure 1 and the header it connects to in the system is shown in Figure 2.

Pin Explanations:

Pin 8 and 7: The SMBUS (SMBD and SMBC): These pins go from the bq78350 to a microprocessor in the system.
Pin 6: BATTV: It is a current limited pin on the Battery side for us to check the direct battery voltage. It is unconnected on the system side.
Pin 5: The System present pin which is connected to the bq78350 and is used to turn on the battery only when the battery is in the system by pulling to low. It is pulled to Pack- on the system side.
Pin 4 and 3: PACK - : This is the high current return path that, on the battery side, is connected to BATT - through the current sense resistors and is the High Power Return path for the system.
Pin 2 and 1: PACK + : This is the high current  supply that, on the battery side, is connected to BATT + through the high-side FETs and it supplies power to the system.

The Questions: 

1) Once mated, the only return path for the SMBUS is PACK - . Are there any issues that can come up by doing this? Is there anyway that noise on this line can cause system failure?
2) Once mated, the System Present pin is connected to PACK - . Are there any issues that can arise from this? Can this cause system failure?

 

I am asking this question because we have had a couple system failures where it seems as if the system just stopped getting power. We want to investigate the battery system as a potential issue.

I have recently changed the pin out of the connectors where pin 6, instead of being the battery test voltage is now a digital ground return that connects to ground to which the bq78350 is connected and the ground  to which the microprocessor is connected on the system side. See the last picture: figure 3

Thanks,

JP

Figure 1: Battery Side Connector

Figure 2: System Side connector

Figure 3: New Battery Side Connector

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